Atomic Force Microscopy Imaging, Measuring and Manipulating Surfaces at the Atomic Scale

With the advent of the atomic force microscope (AFM) came an extremely valuable analytical resource and technique useful for the qualitative and quantitative surface analysis with sub-nanometer resolution. In addition, samples studied with an AFM do not require any special pretreatments that may alt...

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Bibliográfalaš dieđut
Eará dahkkit: Bellitto, Victor (Doaimmaheaddji)
Materiálatiipa: Elektrovnnalaš Girjji oassi
Giella:eaŋgalasgiella
Almmustuhtton: IntechOpen 2012
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DOAB: description of the publication
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