Atomic Force Microscopy Imaging, Measuring and Manipulating Surfaces at the Atomic Scale

• Άλλοι συγγραφείς: Bellitto, Victor (Επιμελητής έκδοσης)
• Μορφή: Ηλεκτρονική πηγή Κεφάλαιο βιβλίου
• Γλώσσα: Αγγλικά
• Έκδοση: IntechOpen 2012
• Θέματα: Spectrum analysis, spectrochemistry, mass spectrometry; Electrochemistry & magnetochemistry
• Διαθέσιμο Online: DOAB: download the publication; DOAB: description of the publication

With the advent of the atomic force microscope (AFM) came an extremely valuable analytical resource and technique useful for the qualitative and quantitative surface analysis with sub-nanometer resolution. In addition, samples studied with an AFM do not require any special pretreatments that may alt...