Scanning Probe Microscopy Physical Property Characterization at Nanoscale

Scanning probe microscopy (SPM) is one of the key enabling tools for the advancement for nanotechnology with applications in many interdisciplinary research areas. This book presents selected original research works on the application of scanning probe microscopy techniques for the characterization...

Popoln opis

Shranjeno v:
Bibliografske podrobnosti
Drugi avtorji: Nalladega, Vijay (Editor)
Format: Elektronski Book Chapter
Jezik:angleščina
Izdano: IntechOpen 2012
Teme:
Online dostop:DOAB: download the publication
DOAB: description of the publication
Oznake: Označite
Brez oznak, prvi označite!

Internet

DOAB: download the publication
DOAB: description of the publication

3rd Floor Main Library

Podrobnosti zaloge 3rd Floor Main Library
Signatura: A1234.567
Kopija 1 Prosto