Scanning Probe Microscopy Physical Property Characterization at Nanoscale

Scanning probe microscopy (SPM) is one of the key enabling tools for the advancement for nanotechnology with applications in many interdisciplinary research areas. This book presents selected original research works on the application of scanning probe microscopy techniques for the characterization...

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Bibliographic Details
Other Authors: Nalladega, Vijay (Editor)
Format: Electronic Book Chapter
Language:English
Published: IntechOpen 2012
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Call Number: A1234.567
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