Scanning Probe Microscopy Physical Property Characterization at Nanoscale

• Diğer Yazarlar: Nalladega, Vijay (Editör)
• Materyal Türü: Elektronik Kitap Bölümü
• Dil: İngilizce
• Baskı/Yayın Bilgisi: IntechOpen 2012
• Konular: Spectrum analysis, spectrochemistry, mass spectrometry; Electrochemistry & magnetochemistry
• Online Erişim: DOAB: download the publication; DOAB: description of the publication

Scanning probe microscopy (SPM) is one of the key enabling tools for the advancement for nanotechnology with applications in many interdisciplinary research areas. This book presents selected original research works on the application of scanning probe microscopy techniques for the characterization...