Chapter MEMS Technologies Enabling the Future Wafer Test Systems
As the form factor of microelectronic systems and chips are continuing to shrink, the demand for increased connectivity and functionality shows an unabated rising trend. This is driving the evolution of technologies that requires 3D approaches for the integration of devices and system design. The 3D...
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| Format: | Electronic Book Chapter |
| Language: | English |
| Published: |
InTechOpen
2018
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| Online Access: | DOAB: download the publication DOAB: description of the publication |
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Internet
DOAB: download the publicationDOAB: description of the publication
3rd Floor Main Library
| Call Number: |
A1234.567 |
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| Copy 1 | Available |