Tunaboylu, B., & Soydan, A. M. (2018). Chapter MEMS Technologies Enabling the Future Wafer Test Systems. InTechOpen.
Chicago Style (17th ed.) CitationTunaboylu, Bahadir, and Ali M. Soydan. Chapter MEMS Technologies Enabling the Future Wafer Test Systems. InTechOpen, 2018.
MLA (9th ed.) CitationTunaboylu, Bahadir, and Ali M. Soydan. Chapter MEMS Technologies Enabling the Future Wafer Test Systems. InTechOpen, 2018.
Warning: These citations may not always be 100% accurate.