Chapter Opportunities of Scanning Probe Microscopy for Electrical, Mechanical and Electromechanical Research of Semiconductor Nanowires
In this chapter, three types of phenomena (electrical, mechanical, and electromechanical) that can be investigated in individual III-V semiconductor nanowires with scanning probe microscope are presented. Transport measurements in GaAs nanowires based on stable electric connection provided opportuni...
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| Autres auteurs: | , |
| Format: | Électronique Chapitre de livre |
| Langue: | anglais |
| Publié: |
InTechOpen
2017
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| Accès en ligne: | DOAB: download the publication DOAB: description of the publication |
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A1234.567 |
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| Exemplaire 1 | Disponible |