Challenges and New Trends in Power Electronic Devices Reliability

• Other Authors: Falco, Pasquale De (Editor), Chiodo, Elio (Editor), Di Noia, Luigi Pio (Editor)
• Format: Electronic Book Chapter
• Language: English
• Published: Basel, Switzerland MDPI - Multidisciplinary Digital Publishing Institute 2021
• Subjects: Technology: general issues; Energy industries & utilities; photovoltaic system; battery; DC-coupled configuration; AC-coupled configuration; mission profile; reliability; LED; thermal cycling test; accelerated test; solder joint; cracks; current harmonics; voltage harmonics; power electronic converters; cables; capacitors; PPS; high-power thyristors; reverse recovery currents; electromagnetic launching field; segmented LSTM; microgrid inverter; IGBT reliability; online evaluation; fusion algorithm; multi-chip IGBT module; bond wire; module transconductance; temperature calibration; failure monitoring; sensor lamp; low-light mode; high-light mode; AC motor drive; junction temperature; lifetime prediction; power MOSFET; loss modeling; SiC MOSFET; AlGaN/GaN HEMT; cascode structure; single event effects; technology computer-aided design simulation; heavy-ion irradiation experiment; photovoltaic systems; DC/AC converter; maintenance; power system faults; availability; condition monitoring; power device; power electronics; n/a
• Online Access: DOAB: download the publication; DOAB: description of the publication

The rapid increase in new power electronic devices and converters for electric transportation and smart grid technologies requires a deepanalysis of their component performances, considering all of the different environmental scenarios, overload conditions, and high stressoperations. Therefore, eval...