Challenges and New Trends in Power Electronic Devices Reliability

• Tác giả khác: Falco, Pasquale De (Biên tập viên), Chiodo, Elio (Biên tập viên), Di Noia, Luigi Pio (Biên tập viên)
• Định dạng: Điện tử Chương của sách
• Ngôn ngữ: Tiếng Anh
• Được phát hành: Basel, Switzerland MDPI - Multidisciplinary Digital Publishing Institute 2021
• Những chủ đề: Technology: general issues; Energy industries & utilities; photovoltaic system; battery; DC-coupled configuration; AC-coupled configuration; mission profile; reliability; LED; thermal cycling test; accelerated test; solder joint; cracks; current harmonics; voltage harmonics; power electronic converters; cables; capacitors; PPS; high-power thyristors; reverse recovery currents; electromagnetic launching field; segmented LSTM; microgrid inverter; IGBT reliability; online evaluation; fusion algorithm; multi-chip IGBT module; bond wire; module transconductance; temperature calibration; failure monitoring; sensor lamp; low-light mode; high-light mode; AC motor drive; junction temperature; lifetime prediction; power MOSFET; loss modeling; SiC MOSFET; AlGaN/GaN HEMT; cascode structure; single event effects; technology computer-aided design simulation; heavy-ion irradiation experiment; photovoltaic systems; DC/AC converter; maintenance; power system faults; availability; condition monitoring; power device; power electronics; n/a
• Truy cập trực tuyến: DOAB: download the publication; DOAB: description of the publication

The rapid increase in new power electronic devices and converters for electric transportation and smart grid technologies requires a deepanalysis of their component performances, considering all of the different environmental scenarios, overload conditions, and high stressoperations. Therefore, eval...