Optical In-Process Measurement Systems

• Other Authors: Fischer, Andreas (Editor)
• Format: Electronic Book Chapter
• Language: English
• Published: Basel MDPI - Multidisciplinary Digital Publishing Institute 2022
• Subjects: Technology: general issues; History of engineering & technology; speckle photography; in-process measurement; deep rolling process; generalized phase shifting interferometry; dual-aperture common-path interferometer; real-time optical instrumentation; optomechatronic systems; electrical steel; optical coherence tomography; OCT; scanning; process monitoring; laser material processing; spot compensation; low coherence interferometry; LCI; wind lidar; Doppler lidar; bistatic; metrology; traceability; wind energy; meteorology; diffraction grating; grating pitch; mode-locked femtosecond laser; laser diffraction; diffraction equation; measurement uncertainty analysis; image processing; pattern recognition; wind energy turbines; turbulence wedges; coherence scanning interferometry; in-process application; Mirau interferometer; vibration compensation; interferometric distance sensor; optical path length modulation; oscillating reference mirror; hairpin; laser welding; semantic segmentation; dilated convolution; sdu-net; spatter detection; quality assurance; fast prediction time; in situ measurement; optical metrology; quality control; interferometry; fringe projection; computational shear interferometry; coherence function; structure function; additive manufacturing; medium voltage switchgear; SF6 alternatives; UV-Vis spectroscopy; gas mixing modeling; multicomponent diffusion analysis; explosion; coal dust; methane; explosion suppression; spectral characteristics; explosion pressure; radiation intensity; free radicals; n/a
• Online Access: DOAB: download the publication; DOAB: description of the publication

Information is key, which means that measurements are key. For this reason, this book provides unique insight into state-of-the-art research works regarding optical measurement systems. Optical systems are fast and precise, and the ongoing challenge is to enable optical principles for in-process mea...