Recent Developments in Atomic Force Microscopy and Raman Spectroscopy for Materials Characterization

• Autres auteurs: Shakher Pathak, Chandra (Éditeur intellectuel), Kumar, Samir (Éditeur intellectuel)
• Format: Électronique Chapitre de livre
• Langue: anglais
• Publié: IntechOpen 2022
• Sujets: Condensed matter physics (liquid state & solid state physics)
• Accès en ligne: DOAB: download the publication; DOAB: description of the publication

This book contains chapters that describe advanced atomic force microscopy (AFM) modes and Raman spectroscopy. It also provides an in-depth understanding of advanced AFM modes and Raman spectroscopy for characterizing various materials. This volume is a useful resource for a wide range of readers, i...