Recent Developments in Atomic Force Microscopy and Raman Spectroscopy for Materials Characterization
This book contains chapters that describe advanced atomic force microscopy (AFM) modes and Raman spectroscopy. It also provides an in-depth understanding of advanced AFM modes and Raman spectroscopy for characterizing various materials. This volume is a useful resource for a wide range of readers, i...
Gorde:
| Beste egile batzuk: | , |
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| Formatua: | Baliabide elektronikoa Liburu kapitulua |
| Hizkuntza: | ingelesa |
| Argitaratua: |
IntechOpen
2022
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| Gaiak: | |
| Sarrera elektronikoa: | DOAB: download the publication DOAB: description of the publication |
| Etiketak: |
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| Gaia: | This book contains chapters that describe advanced atomic force microscopy (AFM) modes and Raman spectroscopy. It also provides an in-depth understanding of advanced AFM modes and Raman spectroscopy for characterizing various materials. This volume is a useful resource for a wide range of readers, including scientists, engineers, graduate students, postdoctoral fellows, and scientific professionals working in specialized fields such as AFM, photovoltaics, 2D materials, carbon nanotubes, nanomaterials, and Raman spectroscopy. |
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| Deskribapen fisikoa: | 1 electronic resource (274 p.) |
| ISBN: | intechopen.94185 9781839682308 9781839682292 9781839682315 |
| Sartu: | Open Access |