Recent Developments in Atomic Force Microscopy and Raman Spectroscopy for Materials Characterization
This book contains chapters that describe advanced atomic force microscopy (AFM) modes and Raman spectroscopy. It also provides an in-depth understanding of advanced AFM modes and Raman spectroscopy for characterizing various materials. This volume is a useful resource for a wide range of readers, i...
Kaydedildi:
| Diğer Yazarlar: | , |
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| Materyal Türü: | Elektronik Kitap Bölümü |
| Dil: | İngilizce |
| Baskı/Yayın Bilgisi: |
IntechOpen
2022
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| Konular: | |
| Online Erişim: | DOAB: download the publication DOAB: description of the publication |
| Etiketler: |
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Internet
DOAB: download the publicationDOAB: description of the publication
3rd Floor Main Library
| Yer Numarası: |
A1234.567 |
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| Kopya Bilgisi 1 | Kütüphanede |