Recent Developments in Atomic Force Microscopy and Raman Spectroscopy for Materials Characterization
This book contains chapters that describe advanced atomic force microscopy (AFM) modes and Raman spectroscopy. It also provides an in-depth understanding of advanced AFM modes and Raman spectroscopy for characterizing various materials. This volume is a useful resource for a wide range of readers, i...
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| Other Authors: | , |
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| Format: | Electronic Book Chapter |
| Language: | English |
| Published: |
IntechOpen
2022
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| Subjects: | |
| Online Access: | DOAB: download the publication DOAB: description of the publication |
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