Photoelastic and finite element stress analysis reliability for implant-supported system stress investigation
Aim: To compare the reliability between photoelastic and finite element (FE) analyses by evaluating the effect of different marginal misfit levels on the stresses generated on two different implant-supported systems using conventional and short implants. Methods: Two photoelastic models were obtaine...
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Main Authors: | , , , , , |
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Format: | Book |
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Universidade Estadual de Campinas,
2018-07-01T00:00:00Z.
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A1234.567 |
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Copy 1 | Available |