Photoelastic and finite element stress analysis reliability for implant-supported system stress investigation

Aim: To compare the reliability between photoelastic and finite element (FE) analyses by evaluating the effect of different marginal misfit levels on the stresses generated on two different implant-supported systems using conventional and short implants. Methods: Two photoelastic models were obtaine...

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Main Authors: Anna Gabriella Camacho Presotto (Author), Cláudia Lopes Brilhante Bhering (Author), Ricardo Armini Caldas (Author), Rafael Leonardo Xediek Consani (Author), Valentim Adelino Ricardo Barão (Author), Marcelo Ferraz Mesquita (Author)
Format: Book
Published: Universidade Estadual de Campinas, 2018-07-01T00:00:00Z.
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