Reliability and Failure Mode of Ti-Base Abutments Supported by Narrow/Wide Implant Systems

• Glavni autori: Ernesto B. Benalcázar-Jalkh (Autor), Laura F. de Carvalho (Autor), Larissa M. M. Alves (Autor), Tiago M. B. Campos (Autor), Edisa de Oliveira Sousa (Autor), Edmara T. P. Bergamo (Autor), Paulo G. Coelho (Autor), Petra C. Gierthmuehlen (Autor), Frank A. Spitznagel (Autor), Abbas Zahoui (Autor), Estevam A. Bonfante (Autor)
• Format: Knjiga
• Izdano: MDPI AG, 2023-08-01T00:00:00Z.
• Teme: article
• Online pristup: Connect to this object online.

To assess the reliability and failure modes of Ti-base abutments supported by narrow and wide-diameter implant systems. Narrow (Ø3.5 × 10 mm) and wide (Ø5 × 10 mm) implant systems of two different manufacturers with internal conical connections (16°) and their respective Ti-base abutments (3.5 and 4...