طريقة تجريبية بسيطة لتقدير عرض فجوة الطاقة في السيليكون
In this work, energy band gap is estimated by passing small forward current through silicon junction diode. The junction voltage variation is studied versus temperature at constant current, and the T-V curve is drawn. From temperature - voltage curve, energy gap is determined. The temperature depend...
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| Formato: | Libro |
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Tishreen University,
2018-01-01T00:00:00Z.
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| Acceso en línea: | Connect to this object online. |
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| Número de Clasificación: |
A1234.567 |
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| Copia 1 | Disponible |