Fractographic analysis of fractured dental implant components
Background/purpose: This study investigated in seven patients the main causes of accidental fractures of various implant components. Materials and methods: We used a scanning electron microscope and transmission electron microscope to observe the fracture interfaces of four fixtures, six abutment sc...
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Format: | Book |
Published: |
Elsevier,
2013-03-01T00:00:00Z.
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Internet
Connect to this object online.3rd Floor Main Library
Call Number: |
A1234.567 |
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Copy 1 | Available |