Comparative analysis of Optical Microscopy, Scanning Electron Microscopy, and Micro-Computed Tomography on measurements

• Main Authors: Frederick Khalil Karam (Author), Karla Zancope (Author), Thiago de Almeida Prado Naves Carneiro (Author), Murilo Navarro de Oliviera (Author), Caio César Dias Resende (Author), Flávio Domingues das Neves (Author)
• פורמט: ספר
• יצא לאור: Universidade Estadual de Campinas, 2017-12-01T00:00:00Z.
• נושאים: article
• גישה מקוונת: Connect to this object online.

Microscopic measurements are widely used in scientific research and the correct equipment to realize these evaluations could be critical to determine study results. Regarding microscopic measurements, three of the most used methods are: Optical Microscopy (OM), Scanning Electron Microscopy (SEM), an...