Constellation loss: Improving the efficiency of deep metric learning loss functions for the optimal embedding of histopathological images

Background: Deep learning diagnostic algorithms are proving comparable results with human experts in a wide variety of tasks, and they still require a huge amount of well-annotated data for training, which is often non affordable. Metric learning techniques have allowed a reduction in the required a...

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Bibliographic Details
Main Authors: Alfonso Medela (Author), Artzai Picon (Author)
Format: Book
Published: Elsevier, 2020-01-01T00:00:00Z.
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3rd Floor Main Library

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Call Number: A1234.567
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