Comparison of Real Time Nanoparticle Monitoring Instruments in the Workplaces

• Main Authors: Seunghon Ham (Author), Naroo Lee (Author), Igchun Eom (Author), Byoungcheun Lee (Author), Perng-Jy Tsai (Author), Kiyoung Lee (Author), Chungsik Yoon (Author)
• Format: Book
• Published: Elsevier, 2016-12-01T00:00:00Z.
• Subjects: article
• Online Access: Connect to this object online.

Background: Relationships among portable scanning mobility particle sizer (P-SMPS), condensation particle counter (CPC), and surface area monitor (SAM), which are different metric measurement devices, were investigated, and two widely used research grade (RG)-SMPSs were compared to harmonize the mea...