Prevalence and Risk Factors for Positive Surgical Margin after Loop Electrosurgical Excision Procedure (LEEP) in Patients with High Grade Squamous Intraepithelial Lesion

• Autores principales: Palaporn Kanjanasirirut (Autor), Kamol Pataradool (Autor), Sumonmal Manusirivithaya (Autor), Chadakarn Phaloprakarn (Autor), Chutima Chavanisakun (Autor)
• Formato: Libro
• Publicado: The Royal Thai College of Obstetricians and Gynaecologists, 2015-12-01T00:00:00Z.
• Materias: article
• Acceso en línea: Connect to this object online.

Objective: To determine the prevalence and risk factors for positive surgical margin after LEEP in patients with high grade squamous intraepithelial lesion (HSIL). Material and Methods: Medical records of all women (n = 575) who underwent LEEP and histopathological diagnosed HSIL between January 200...