Scanning electron microscopic analysis of adherent bacterial biofilms associated with peri‐implantitis

• প্রধান লেখক: Jae W. Chang (লেখক), Jiarui Bi (লেখক), Gethin Owen (লেখক), Ya Shen (লেখক), Markus Haapasalo (লেখক), Colin Wiebe (লেখক), Rana Tarzemany (লেখক), Hannu Larjava (লেখক)
• বিন্যাস: গ্রন্থ
• প্রকাশিত: Wiley, 2023-08-01T00:00:00Z.
• বিষয়গুলি: article
• অনলাইন ব্যবহার করুন: Connect to this object online.

Abstract Objectives Peri‐implantitis (PI) is caused by bacteria in the peri‐implant space but the consensus on microbial profile is still lacking. Current microbial sampling of PI lesions has largely focused on analyzing bacterial species that have been shed from the implant surface and captured in...