Variation of Bulk Etch Rate and some other Etching Parameters with Etching Temperature for Cellulose Nitrate LR-115 Detector

Abstract<br /> In the present work, the variation of the bulk etch rate and some other etching parameters, such as removed active-layer thickness, track growing rate, track etch rate with etching temperature is measured for the solid-state nuclear track detector (SSNTD) LR-115 type 2. The mass...

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Autore principale: Ali Hussain (Autore)
Natura: Libro
Pubblicazione: College of Education for Pure Sciences, 2009-09-01T00:00:00Z.
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