Fluorine depth profiles in human enamel after different acid etching times

• Κύριοι συγγραφείς: Sampson W.J (Συγγραφέας), Wookey C. W. (Συγγραφέας), Rouse J. (Συγγραφέας)
• Μορφή: Βιβλίο
• Έκδοση: Sciendo, 1987-03-01T00:00:00Z.
• Θέματα: article
• Διαθέσιμο Online: Connect to this object online.

This study was designed to monitor fluorine concentration changes in the surface layer of enamel subjected to acid etching for orthodontic direct bonding. Prior to etching, the area described by the reference pins was partitioned into quadrants and initial fluorine concentration profiles in the surf...