Chapter MEMS Technologies Enabling the Future Wafer Test Systems

As the form factor of microelectronic systems and chips are continuing to shrink, the demand for increased connectivity and functionality shows an unabated rising trend. This is driving the evolution of technologies that requires 3D approaches for the integration of devices and system design. The 3D...

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Bibliografske podrobnosti
Glavni avtor: Tunaboylu, Bahadir (auth)
Drugi avtorji: Soydan, Ali M. (auth)
Format: Elektronski Book Chapter
Jezik:angleščina
Izdano: InTechOpen 2018
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