Chapter MEMS Technologies Enabling the Future Wafer Test Systems

As the form factor of microelectronic systems and chips are continuing to shrink, the demand for increased connectivity and functionality shows an unabated rising trend. This is driving the evolution of technologies that requires 3D approaches for the integration of devices and system design. The 3D...

Full description

Saved in:
Bibliographic Details
Main Author: Tunaboylu, Bahadir (auth)
Other Authors: Soydan, Ali M. (auth)
Format: Electronic Book Chapter
Language:English
Published: InTechOpen 2018
Subjects:
Online Access:OAPEN Library: download the publication
OAPEN Library: description of the publication
Tags: Add Tag
No Tags, Be the first to tag this record!

Internet

OAPEN Library: download the publication
OAPEN Library: description of the publication

3rd Floor Main Library

Holdings details from 3rd Floor Main Library
Call Number: A1234.567
Copy 1 Available