Chapter MEMS Technologies Enabling the Future Wafer Test Systems

As the form factor of microelectronic systems and chips are continuing to shrink, the demand for increased connectivity and functionality shows an unabated rising trend. This is driving the evolution of technologies that requires 3D approaches for the integration of devices and system design. The 3D...

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Bibliografische gegevens
Hoofdauteur: Tunaboylu, Bahadir (auth)
Andere auteurs: Soydan, Ali M. (auth)
Formaat: Elektronisch Hoofdstuk
Taal:Engels
Gepubliceerd in: InTechOpen 2018
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