Abbildende Ellipsometrie mit Lichtwegumkehrung für die optische Charakterisierung von gekrümmten Oberflächen
Ellipsometry is a measuring method for surface characterization and thin-film measurement of flat surfaces using polarized light. However, a new measuring principle based on return-path ellipsometry and retroreflection enables the detection of free-form surfaces. This new measurement principle and r...
I tiakina i:
| Kaituhi matua: | |
|---|---|
| Hōputu: | Tāhiko Wāhanga pukapuka |
| I whakaputaina: |
KIT Scientific Publishing
2023
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| Rangatū: | Schriftenreihe Automatische Sichtprüfung und Bildverarbeitung
6 |
| Ngā marau: | |
| Urunga tuihono: | OAPEN Library: download the publication OAPEN Library: description of the publication |
| Ngā Tūtohu: |
Tāpirihia he Tūtohu
Kāore He Tūtohu, Me noho koe te mea tuatahi ki te tūtohu i tēnei pūkete!
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