Abbildende Ellipsometrie mit Lichtwegumkehrung für die optische Charakterisierung von gekrümmten Oberflächen
Ellipsometry is a measuring method for surface characterization and thin-film measurement of flat surfaces using polarized light. However, a new measuring principle based on return-path ellipsometry and retroreflection enables the detection of free-form surfaces. This new measurement principle and r...
Kaydedildi:
| Yazar: | |
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| Materyal Türü: | Elektronik Kitap Bölümü |
| Baskı/Yayın Bilgisi: |
KIT Scientific Publishing
2023
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| Seri Bilgileri: | Schriftenreihe Automatische Sichtprüfung und Bildverarbeitung
6 |
| Konular: | |
| Online Erişim: | OAPEN Library: download the publication OAPEN Library: description of the publication |
| Etiketler: |
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Internet
OAPEN Library: download the publicationOAPEN Library: description of the publication
3rd Floor Main Library
| Yer Numarası: |
A1234.567 |
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| Kopya Bilgisi 1 | Kütüphanede |