Abbildende Ellipsometrie mit Lichtwegumkehrung für die optische Charakterisierung von gekrümmten Oberflächen
Ellipsometry is a measuring method for surface characterization and thin-film measurement of flat surfaces using polarized light. However, a new measuring principle based on return-path ellipsometry and retroreflection enables the detection of free-form surfaces. This new measurement principle and r...
Spremljeno u:
| Glavni autor: | |
|---|---|
| Format: | Elektronički Poglavlje knjige |
| Izdano: |
KIT Scientific Publishing
2023
|
| Serija: | Schriftenreihe Automatische Sichtprüfung und Bildverarbeitung
6 |
| Teme: | |
| Online pristup: | OAPEN Library: download the publication OAPEN Library: description of the publication |
| Oznake: |
Dodaj oznaku
Bez oznaka, Budi prvi tko označuje ovaj zapis!
|
Internet
OAPEN Library: download the publicationOAPEN Library: description of the publication
3rd Floor Main Library
| Signatura: |
A1234.567 |
|---|---|
| Primjerak 1 | Dostupno |