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Light Field Imaging for Deflectometry

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Optical measurement methods are becoming increasingly important for high-precision production of components and quality assurance. The increasing demand can be met by modern imaging systems with advanced optics, such as light field cameras. This work explores their use in the deflectometric measurem...

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Бібліографічні деталі
Автор: Uhlig, David (auth)
Формат: Електронний ресурс Частина з книги
Мова:Англійська
Опубліковано: KIT Scientific Publishing 2023
Серія:Forschungsberichte aus der Industriellen Informationstechnik 30
Предмети:
Electrical engineering
phase unwrapping; camera calibration; light field cameral Phasenentfaltung; Kamerakalibrierung; Lichtfeldkamera; surface reconstruction; deflectometry; Oberflächenrekonstruktion; Deflektometrie
Онлайн доступ:OAPEN Library: download the publication
OAPEN Library: description of the publication
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Резюме:Optical measurement methods are becoming increasingly important for high-precision production of components and quality assurance. The increasing demand can be met by modern imaging systems with advanced optics, such as light field cameras. This work explores their use in the deflectometric measurement of specular surfaces. It presents improvements in phase unwrapping and calibration techniques, enabling high surface reconstruction accuracies using only a single monocular light field camera.
Фізичний опис:1 electronic resource (284 p.)
ISBN:KSP/1000159372
Доступ:Open Access

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