Light Field Imaging for Deflectometry

Optical measurement methods are becoming increasingly important for high-precision production of components and quality assurance. The increasing demand can be met by modern imaging systems with advanced optics, such as light field cameras. This work explores their use in the deflectometric measurem...

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Auteur principal: Uhlig, David (auth)
Format: Électronique Chapitre de livre
Langue:anglais
Publié: KIT Scientific Publishing 2023
Collection:Forschungsberichte aus der Industriellen Informationstechnik 30
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