Free space microwave characterization of silicon wafers for microelectronic applications / Zaiki Awang, Deepak Kumar Ghodgaonkar and Noor Hasimah Baba

A contactless and non-destructive microwave method has been developed to characterize silicon semiconductor wafers from reflection and transmission measurements made at normal incidence using MNDT. The measurement system consists of a pair of spot-focusing horn lens antenna, mode transitions, coaxia...

Ful tanımlama

Kaydedildi:
Detaylı Bibliyografya
Asıl Yazarlar: Awang, Zaiki (Yazar), Ghodgaonkar, Deepak Kumar (Yazar), Baba, Noor Hasimah (Yazar)
Materyal Türü: Kitap
Baskı/Yayın Bilgisi: Institute of Research, Development and Commercialisation (IRDC), 2005.
Konular:
Online Erişim:Link Metadata
Etiketler: Etiketle
Etiket eklenmemiş, İlk siz ekleyin!

Benzer Materyaller