NBTI effects on circuit reliability performance of 4-bit Johnson counter based on different simulation configuration / M. F. Zainudin ...[et al.]
Negative-bias temperature instability (NBTI) has become a serious circuit reliability concern as technology nodes decrease to nanometer scales. This paper presents comprehensive analyses of the NBTI effect on 4-bit Johnson Counter with a 16- nm High Performance (HP) Predictive Technology Model (PTM)...
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Main Authors: | Zainudin, M. F. (Author), Hussin, H. (Author), Karim, J. (Author), Halim, A. K. (Author) |
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Format: | Book |
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UiTM Press,
2018-06.
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Online Access: | Link Metadata |
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