NBTI effects on circuit reliability performance of 4-bit Johnson counter based on different simulation configuration / M. F. Zainudin ...[et al.]
Negative-bias temperature instability (NBTI) has become a serious circuit reliability concern as technology nodes decrease to nanometer scales. This paper presents comprehensive analyses of the NBTI effect on 4-bit Johnson Counter with a 16- nm High Performance (HP) Predictive Technology Model (PTM)...
Bewaard in:
Hoofdauteurs: | Zainudin, M. F. (Auteur), Hussin, H. (Auteur), Karim, J. (Auteur), Halim, A. K. (Auteur) |
---|---|
Formaat: | Boek |
Gepubliceerd in: |
UiTM Press,
2018-06.
|
Onderwerpen: | |
Online toegang: | Link Metadata |
Tags: |
Voeg label toe
Geen labels, Wees de eerste die dit record labelt!
|
Gelijkaardige items
-
The importance of corporate image in the marketing of university postgraduate programs / Zainudin Awang.
door: Awang, Zainudin
Gepubliceerd in: (2010) -
Performance analysis of SLA - QoS UPE Metro Ethernet / Akmarul Nizam Zainudin
door: Zainudin, Akmarul Nizam
Gepubliceerd in: (2014) -
Interview for paradox of information / Nor Amirah Mohd Norroe and Nurul Adelina Zainudin
door: Mohd Norroe, Nor Amirah, et al.
Gepubliceerd in: (2015) -
Evolution of information communication technology / Nor Amirah Mohd Norroe and Nurul Adelina Zainudin
door: Mohd Norroe, Nor Amirah, et al.
Gepubliceerd in: (2015) -
Exploring Alternative Pathways to Target Bacterial Type II Topoisomerases Using NBTI Antibacterials: Beyond Halogen-Bonding Interactions
door: Maja Kokot, et al.
Gepubliceerd in: (2023)