Scanning Electron Microscopy
Today, an individual would be hard-pressed to find any science field that does not employ methods and instruments based on the use of fine focused electron and ion beams. Well instrumented and supplemented with advanced methods and techniques, SEMs provide possibilities not only of surface imaging b...
Tallennettuna:
| Muut tekijät: | |
|---|---|
| Aineistotyyppi: | Elektroninen Kirjan osa |
| Kieli: | englanti |
| Julkaistu: |
IntechOpen
2012
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| Aiheet: | |
| Linkit: | DOAB: download the publication DOAB: description of the publication |
| Tagit: |
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