Scanning Electron Microscopy
Today, an individual would be hard-pressed to find any science field that does not employ methods and instruments based on the use of fine focused electron and ion beams. Well instrumented and supplemented with advanced methods and techniques, SEMs provide possibilities not only of surface imaging b...
I tiakina i:
| Ētahi atu kaituhi: | |
|---|---|
| Hōputu: | Tāhiko Wāhanga pukapuka |
| Reo: | Ingarihi |
| I whakaputaina: |
IntechOpen
2012
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| Ngā marau: | |
| Urunga tuihono: | DOAB: download the publication DOAB: description of the publication |
| Ngā Tūtohu: |
Tāpirihia he Tūtohu
Kāore He Tūtohu, Me noho koe te mea tuatahi ki te tūtohu i tēnei pūkete!
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