Entwicklung eines Röntgenmikroskops für Photonenenergien von 15 keV bis 30 keV

In many research areas X-rays are used for analysis. In X-ray full field microscopy a high resolution is achievable independent of the source properties by using imaging lenses. With an objective lens with 100 mm focal length a theoretical resolution of 60nm is achievable at 30 keV. In Experiments a...

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Detaylı Bibliyografya
Yazar: Marschall, Felix (auth)
Materyal Türü: Elektronik Kitap Bölümü
Baskı/Yayın Bilgisi: KIT Scientific Publishing 2014
Seri Bilgileri:Schriften des Instituts für Mikrostrukturtechnik am Karlsruher Institut für Technologie / Hrsg.: Institut für Mikrostrukturtechnik
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Online Erişim:DOAB: download the publication
DOAB: description of the publication
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