Entwicklung eines Röntgenmikroskops für Photonenenergien von 15 keV bis 30 keV

In many research areas X-rays are used for analysis. In X-ray full field microscopy a high resolution is achievable independent of the source properties by using imaging lenses. With an objective lens with 100 mm focal length a theoretical resolution of 60nm is achievable at 30 keV. In Experiments a...

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Bibliografski detalji
Glavni autor: Marschall, Felix (auth)
Format: Elektronički Poglavlje knjige
Izdano: KIT Scientific Publishing 2014
Serija:Schriften des Instituts für Mikrostrukturtechnik am Karlsruher Institut für Technologie / Hrsg.: Institut für Mikrostrukturtechnik
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