Kapak Resmi

Rietveld Refinement in the Characterization of Crystalline Materials

This Special Issue serves as a crystallographic forum covering various aspects of material science that have in common the use of the powerful Rietveld method in the analysis of the powder XRD patterns of investigated compounds.

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Detaylı Bibliyografya
Yazar:	Igor Djerdj (Ed.) (auth)
Materyal Türü:	Elektronik Kitap Bölümü
Dil:	İngilizce
Baskı/Yayın Bilgisi:	MDPI - Multidisciplinary Digital Publishing Institute 2019
Konular:	Chemistry Rietveld method Structural characterization Microstructural analysis Crystalline materials Structural materials X-ray and neutron diffraction Functional materials
Online Erişim:	DOAB: download the publication DOAB: description of the publication
Etiketler:	Etiketle Etiket eklenmemiş, İlk siz ekleyin!

Diğer Bilgiler
Özet:	This Special Issue serves as a crystallographic forum covering various aspects of material science that have in common the use of the powerful Rietveld method in the analysis of the powder XRD patterns of investigated compounds.
Fiziksel Özellikler:	1 electronic resource (88 p.)
ISBN:	books978-3-03897-528-1 9783038975281 9783038975274
Erişim:	Open Access