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Rietveld Refinement in the Characterization of Crystalline Materials

This Special Issue serves as a crystallographic forum covering various aspects of material science that have in common the use of the powerful Rietveld method in the analysis of the powder XRD patterns of investigated compounds.

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Detalles Bibliográficos
Autor principal:	Igor Djerdj (Ed.) (auth)
Formato:	Electrónico Capítulo de libro
Lenguaje:	inglés
Publicado:	MDPI - Multidisciplinary Digital Publishing Institute 2019
Materias:	Chemistry Rietveld method Structural characterization Microstructural analysis Crystalline materials Structural materials X-ray and neutron diffraction Functional materials
Acceso en línea:	DOAB: download the publication DOAB: description of the publication
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Descripción
Sumario:	This Special Issue serves as a crystallographic forum covering various aspects of material science that have in common the use of the powerful Rietveld method in the analysis of the powder XRD patterns of investigated compounds.
Descripción Física:	1 electronic resource (88 p.)
ISBN:	books978-3-03897-528-1 9783038975281 9783038975274
Acceso:	Open Access