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Rietveld Refinement in the Characterization of Crystalline Materials

This Special Issue serves as a crystallographic forum covering various aspects of material science that have in common the use of the powerful Rietveld method in the analysis of the powder XRD patterns of investigated compounds.

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Bibliografische gegevens
Hoofdauteur:	Igor Djerdj (Ed.) (auth)
Formaat:	Elektronisch Hoofdstuk
Taal:	Engels
Gepubliceerd in:	MDPI - Multidisciplinary Digital Publishing Institute 2019
Onderwerpen:	Chemistry Rietveld method Structural characterization Microstructural analysis Crystalline materials Structural materials X-ray and neutron diffraction Functional materials
Online toegang:	DOAB: download the publication DOAB: description of the publication
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Omschrijving
Samenvatting:	This Special Issue serves as a crystallographic forum covering various aspects of material science that have in common the use of the powerful Rietveld method in the analysis of the powder XRD patterns of investigated compounds.
Fysieke beschrijving:	1 electronic resource (88 p.)
ISBN:	books978-3-03897-528-1 9783038975281 9783038975274
Toegang:	Open Access