Recent Developments in Atomic Force Microscopy and Raman Spectroscopy for Materials Characterization

This book contains chapters that describe advanced atomic force microscopy (AFM) modes and Raman spectroscopy. It also provides an in-depth understanding of advanced AFM modes and Raman spectroscopy for characterizing various materials. This volume is a useful resource for a wide range of readers, i...

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Diğer Yazarlar: Shakher Pathak, Chandra (Editör), Kumar, Samir (Editör)
Materyal Türü: Elektronik Kitap Bölümü
Dil:İngilizce
Baskı/Yayın Bilgisi: IntechOpen 2022
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Online Erişim:DOAB: download the publication
DOAB: description of the publication
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