Recent Developments in Atomic Force Microscopy and Raman Spectroscopy for Materials Characterization

• अन्य लेखक: Shakher Pathak, Chandra (संपादक), Kumar, Samir (संपादक)
• स्वरूप: इलेक्ट्रोनिक पुस्तक अध्याय
• भाषा: अंग्रेज़ी
• प्रकाशित: IntechOpen 2022
• विषय: Condensed matter physics (liquid state & solid state physics)
• ऑनलाइन पहुंच: DOAB: download the publication; DOAB: description of the publication

This book contains chapters that describe advanced atomic force microscopy (AFM) modes and Raman spectroscopy. It also provides an in-depth understanding of advanced AFM modes and Raman spectroscopy for characterizing various materials. This volume is a useful resource for a wide range of readers, i...